Left RF Probe Positioner

Product Description

FTF0003 probe positioner is a high-precision adjustment component designed by FIN TEST for RF probe stations and wafer test platforms. It supports XYZ three-axis fine adjustment, angle adjustment, and large-range height adjustment. Equipped with an adjustable magnetic chuck, it enables easy installation and accurate positioning. Suitable for chip characterization, RF device testing, wafer probe positioning, and other applications. Used for left-side RF probe adjustment.

Key Specifications

• XYZ travel range: ±5 mm, adjustment accuracy: 0.01 mm
• Probe angle adjustment: ±5°
• Mechanical height adjustment: -20 mm ~ +30 mm
• Mounting specification: 3 × M4 through holes
• Fixing method: Adjustable magnetic chuck
• Overall dimensions: 128 mm / 109 mm / 66 mm

Product Features

• High-precision XYZ three-axis fine adjustment, stable and reliable positioning
• ±5° angle adjustment for different test postures
• Large-range height adjustment compatible with various test requirements
• Magnetic chuck installation for quick fixation and easy movement
• Precision machining with high consistency