Area B, 8 floor, Building 1, No 615, Ningqiao Road, Pudong, Shangha

IEEE P370 De-Embedding Kit

Now: Products > IEEE P370 De-Embedding Kit

Name: IEEE P370 De-Embedding KitDescription:

Outline
Application
Documents

IEEE P370 De-Embedding Algorithm Verification Kit

Part Number: FTA-P370

Product Description

The IEEE P370 De-Embedding Algorithm Verification Kit is a standardized PCB calibration test suite launched by Fin-Test. Designated as the official verification carrier by the IEEE P370 Standards Committee with NIST traceability, it is used to evaluate the accuracy of high-speed PCB S-parameter de-embedding algorithms and perform lossless EM model tuning for PCB interconnects. Equipped with 9 high-precision PCB test coupons made of Rogers 4003 material, it comes with metrology-grade RF connectors, phase-matched adapters and zero-length short calibration components. Compatible with two mainstream de-embedding methodologies (2x-Thru and Open-Short), it supports measurement frequencies up to 60 GHz. All test data is repeatable and comparable, making it a core standardized verification instrument for next-generation data center and RF millimeter-wave laboratories.

Applications

Accuracy comparison and validation of self-developed & commercial S-parameter de-embedding algorithms
Signal integrity calibration tests for DDR / PCIe / OSFP high-speed serial links
Performance benchmarking of 2x-Thru and Open-Short de-embedding solutions
Extreme condition testing for impedance mismatch & series via discontinuities
Lossless electromagnetic model calibration based on Beatty standard PCB interconnects
Metrology traceability reference for RF labs & teaching benchmark for university SI courses
Precision verification of de-embedding modules for EDA simulation software

Key Features

Compliant with IEEE P370 international standard, supported by 4 DesignCon/IEEE authoritative papers, NIST traceable

9 high-precision Rogers 4003 PCB coupons with NiAu plating (min 75μm gold thickness), standard trace width 17.3mil

Three coupon types: DUT reference devices, paired A/B test fixtures, 3cm 2x-Thru calibration board

Deliberately designed defective vias & 105% nominal impedance (45Ω) structure to test algorithm robustness

Optional RF interfaces: 2.92mm / 2.40mm / 1.85mm, full coverage DC ~ 60GHz

Supplied with phase-matched M/M & M/F adapters, zero-length Flush Short calibration piece

19 standardized measurement sequences & 8 authoritative de-embedding error calculation schemes, ready-to-test out of box

Free supplementary resources: DXF simulation files, full measured S-parameters, IEEE open-source algorithm, ADS tuning project files

Kit Bill of Materials

Standard PCB: 6cm Microstrip DUT, 6cm Beatty Standard Resonance DUT (2 reference coupons)

Standard PCB: Paired A/B fixtures for 50Ω / Series Via / 105% Impedance (6 coupons)

Standard PCB: 3cm Microstrip 2x-Thru Calibration Board (1 piece)

Optional Accessories: 18 Edge-mount Coaxial Connectors, 2 M/F & 2 M/M Phase-Matched Adapters

Optional Accessories: 1 Male Zero-Length Flush Short for single-port Open / Short calibration

Versions

2.92mm Full Kit: Bare PCB + Complete Connectors/Adapters/Flush Short

1.85mm Full Kit: Bare PCB + Complete Connectors/Adapters/Flush Short

Test Parameters

SDD21 6cm Microstrip DUT Insertion Loss Curve

Measured differential insertion loss from 0 to 60GHz

SDD11 6cm Microstrip DUT Return Loss Curve

Measured differential return loss from 0 to 60GHz

TDR Impedance Profile of All Test Coupons

TDR impedance waveform of Beatty standard, standard microstrip & 105% impedance fixture

De-Embedding Error Comparison Curve

Insertion loss, absolute & relative error comparison between raw DUT and de-embedded results

Prev: None
Next: None

Back