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81GHz Radar Chip Test socket

Now: Products > 81GHz Radar Chip Test socket

Name: 81GHz Radar Chip Test socketDescription: High-precision, high-stability radar chip testing solution, providing reliable testing guarantees for automotive and industrial radar chips

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81GHz Low Loss Radar Chip Test Socket - Product Details

81GHz Low Loss Radar Chip Test Socket

High-precision, high-stability radar chip testing solution, providing reliable testing guarantees for automotive and industrial radar chips

High Stability Full Band Adaptation Industrial Grade Durability Low Loss Transmission

Core Product Advantages

  • Ultra-wide Frequency Coverage

    DC-90GHz full-band adaptation, precisely targeting 77/79GHz automotive radar + W-band chip testing scenarios, meeting diverse testing needs

  • Ultra-low Loss Transmission

    Insertion loss < -0.2dB, zero signal distortion, more reliable test data, ensuring accuracy in chip performance evaluation

  • Stable Structure and RF Performance

    Adopting all-metal structure and precision spring probe design, effectively suppressing signal crosstalk and isolation between channels, maintaining consistent performance in complex environments

  • Industrial Grade Durability

    ≥100,000 insertion/extraction cycles, meeting the high-efficiency, high-frequency usage requirements of mass production testing, significantly reducing long-term usage costs

Core Parameters Overview

The product has undergone rigorous testing and verification, with all performance indicators reaching industry-leading levels, ensuring the accuracy and reliability of test data

Parameter Name Parameter Value
Frequency Range DC-90GHz
Insertion Loss < -0.2dB
Return Loss < -15dB
Isolation > 40dB
Operating Temperature -55℃ ~ 125℃
Insertion/Extraction Lifespan ≥100,000 cycles

Performance Test Charts

The following are visual charts of key performance tests, intuitively presenting the product's transmission characteristics and stability across different frequency bands

High-frequency Band S-parameter Test Chart

81.61GHz high-frequency band S-parameter test chart showing dB(S(8,7))=-0.130 test result

Test Highlights: At frequency = 81.61GHz, dB(S(8,7)) = -0.130, which is far better than the standard of insertion loss < -0.2dB, verifying the product's ultra-low loss transmission characteristics in high-frequency bands and ensuring signal integrity.

Wide Frequency Band Response Test Chart

10MHz-85GHz wide frequency band response test chart showing signal transmission attenuation curve

Test Highlights: Covering the full frequency band from 10.00MHz to 85.00GHz, the chart shows a stable signal transmission attenuation curve with no significant fluctuations, demonstrating the product's transmission stability across wide frequency bands and adaptability to multiple testing scenarios.

Terminal S-parameter Test Chart

0-140GHz terminal S-parameter test chart showing TXE signal attenuation

Test Highlights: Frequency range 0 ~ 140GHz, cross talk signal attenuation is controlled within a reasonable range with no clutter interference peaks, demonstrating the product's excellent anti-crosstalk capability and channel isolation, maintaining stable performance in complex electromagnetic environments.

Core Application Scenarios

  • Automotive millimeter-wave radar chip mass production testing (adapting to 77/79GHz mainstream frequency bands)
  • W-band radar chip research and development verification (covering DC-90GHz full-band testing requirements)
  • High-precision radar sensor performance evaluation and calibration
  • Millimeter-wave communication equipment RF performance testing

Technical Support Services

  • PCB packaging services: Providing EVB (Evaluation Board)/Load Board simulation optimization services to facilitate rapid construction of test systems and shorten R&D cycles
  • Socket model services: Providing socket simulation optimization models to support performance pre-research and debugging in the early R&D stage, reducing testing costs
  • Customized solutions: Providing customized design and production services according to specific customer testing needs, meeting personalized application scenarios

Contact Us

Phone: 021-68380250
Website: www.fin-test.com
Address: Zone B, 8th Floor, Building 1, Youdu Workshop, 615 Ningqiao Road, Pudong New Area, Shanghai

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