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QFN 4X4 12GHz Switch Chip Test Fixture
Name: QFN 4X4 12GHz Switch Chip Test FixtureDescription:
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FTS0084P: QFN 4X4 12GHz Hybrid Integrated Switch Chip Test Fixture
Specially designed test fixture for high-performance broadband integrated switch chips. Provides precise, reliable RF and DC test interfaces, supports key electrical characteristics evaluation and screening across the full temperature range from -55℃ to 125℃. An ideal tool for R&D verification and mass production testing.
Product Core Highlights
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Broadband Test Adaptation
Perfectly adapts to the wide operating frequency band of the switch from 10MHz to 12.0GHz. Optimized for different performance requirements (such as insertion loss, isolation) before and after the 3.0GHz boundary, ensuring low-loss, high-matching test channels across the entire frequency band for precise S-parameter measurement.
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High Isolation Test Capability
Targeting the switch's high isolation index of up to 50dB (low frequency band) and 30dB (high frequency band), the fixture design strictly controls RF channel crosstalk and leakage, providing superior test port isolation to ensure the accuracy and dynamic range of isolation testing in the "OFF" state, truly reflecting chip performance.
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Nanosecond-Level Switching Time Measurement
Provides high-speed control signal paths and probing interfaces, supporting accurate measurement of switch rise time (tr), fall time (tf), and switching time (ton), meeting verification requirements for less than 30/50ns limit indicators. Optimized grounding and signal integrity design ensures clear, distortion-free high-speed transient waveforms.
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Industrial-Grade Reliability Verification
Complies with relevant standards, with sturdy fixture structure supporting electrical characteristics testing of devices across the full operating temperature range from -55℃ to +125℃. Compatible with reliability test access requirements such as burn-in, temperature cycling, and constant acceleration, supporting high-reliability application verification.
Core Parameters Overview
The following are the key adaptation parameters of the FTS0084P test fixture.
| Parameter Category | Parameter Value / Description |
|---|---|
| Frequency Range (RF) | 10 MHz ~ 12.0 GHz |
| Insertion Loss (IL) @25℃ | ≤ 2.0 dB (f≤3GHz) / ≤ 3.2 dB (f>3GHz) |
| Isolation (ISO) @25℃ | ≥ 50 dB (f≤3GHz) / ≥ 30 dB (f>3GHz) |
| Input/Output Return Loss | ≥ 15 dB / ≥ 20 dB (f≤3GHz) |
| Operating Temperature Range | -55℃ ~ +125℃ |
| Supply Voltage (VEE) | -5 V (Recommended), -6 V (Maximum) |
| Control Voltage (VCTRL) | 0 V (OFF) / 5 V (ON) |
| Adapted Package | QFN 4.00 mm x 4.00 mm, 0.5mm pitch, plastic or ceramic package |
Core Advantages
The FTS0084P test fixture provides the following professional solutions.
High-Precision S-Parameters and Dynamic Testing
Strictly follows standardized test methods, provides calibration reference planes, ensuring network analyzers can accurately measure insertion loss, return loss, and isolation. For different temperature group testing requirements (25℃, 125℃, -55℃), the fixture material is stable with minimal temperature impact on performance.
Integrates high-quality SMA interfaces and internal microstrip transmission lines, optimizes RF paths, maintains good impedance matching up to 12GHz frequency band, minimizing measurement errors introduced by the fixture itself, allowing test results to truly reflect chip performance.
Comprehensive Production and Reliability Test Process Support
Design compatible with screening processes (100% internal visual inspection, temperature cycling, burn-in, etc.), facilitating connection to aging board systems. Provides stable mechanical fixation and electrical connections, ensuring reliable contact during mechanical stress tests such as constant acceleration (29400 m/s²).
Supports intermediate electrical testing, final electrical testing, and end-point electrical testing requirements for periodic inspections, facilitating sampling or 100% testing by users. Clear interface markings and fool-proof design improve production line testing efficiency and consistency.
Core Application Scenarios
- Switch channel testing and screening in airborne/vehicle radar system TR modules or receiving front-ends
- R&D performance verification and evaluation of BW110DSM4M switches in ground electronic reconnaissance and communication equipment
- Performance investigation and characteristic analysis of chips under high and low temperature environments (-55℃ ~ +125℃)
- Accurate measurement and evaluation of dynamic and limit parameters such as switching time and power capacity
- Research and teaching demonstration of high-performance hybrid integrated switch modules in research institutes
Technical Support Services
- Complete Interface Definition and Adaptation Guide: Provides detailed test fixture pin correspondence diagrams, recommended calibration methods (such as SOLT), and operation specifications for connecting DUT, helping users quickly establish test systems and reduce setup errors.
- Calibration and Verification Services: Can provide fixture S-parameter characterization data (Touchstone files), or perform system-level calibration verification with standard load/through parts, ensuring high-frequency testing accuracy. Supports metrology and calibration according to user requirements.
- Customized Integration Consultation: Provides integration solution consultation for user-specific automated test systems (such as with probe stations, temperature chambers). Can discuss fixture adaptability and optimization possibilities based on special testing requirements in mass production (such as parallel testing).