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67GHz RF Burn-in Test Socket
Name: 67GHz RF Burn-in Test SocketDescription: burn-in socket for BGA packaged millimeter-wave chips, designed for mass production high-temperature endurance aging of RF chips
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67GHz RF Burn-in Test Socket
Fin-Test dedicated burn-in socket for BGA packaged millimeter-wave chips, designed for mass production high-temperature endurance aging of RF chips
Product Description
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Low-Stress Precision Probes
Single pin pressure ≤30g to avoid extrusion damage to chip solder balls; separated layout for RF, low-frequency and ground pins, featuring high channel isolation, excellent signal integrity and power integrity.
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High Insulation Withstand Structure
The pin plate and limit frame adopt high-temperature resistant PEEK insulating material, matched with aluminum alloy housing; withstand voltage ≥100V AC, supporting long-term powered high-temperature aging tests.
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Uniform Flip Clamping Mechanism
Built-in plane bearings and multiple sets of stainless steel springs, the knob flip cover slides smoothly with balanced and stable downward pressure, and it is not easy to loosen and fail after tens of thousands of production cycles.
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Dual PCB Platform Compatibility
Compatible with two toolings: SLT system board and ATE load board, equipped with standardized M1.6 mounting holes and standardized PCB gold plating process to prevent pad abrasion.
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High RF Matching DC~67GHz
Return loss ≥10dB, no RF signal attenuation or drift during long-term aging.
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Wide-Temperature Copper Cooling System
Operating temperature range: -50℃ ~ +150℃; the maximum temperature of chip solder balls is ≤140℃ under 110℃ chamber condition.
Spec Overview
RF, Electrical, Mechanical, Thermal & Material Properties
| Category | Item Name | Technical Spec |
|---|---|---|
| RF Performance | Operating Frequency Range | DC ~ 67 GHz |
| RF Performance | RF Return Loss | ≥10dB |
| RF Performance | Dielectric Withstand / Insulation Resistance | ≥100V AC / ≥200 MΩ |
| Low-Frequency Electrical | Max Current Per Pin | 1A per pin |
| Low-Frequency Electrical | Single Pin Contact Resistance | ≤100 mΩ |
| Low-Frequency Electrical | Probe Spec | Φ0.2mm |
| Mechanical Properties | Single Pin Force | ≤30g (Anti-solder ball damage) |
| Mechanical Properties | IC Limit Frame Size | 4.91mm (Tolerance 0~+0.03) |
| Thermal Performance | Operating Temperature | -50℃ ~ +150℃ |
| Thermal Performance | Max Solder Ball Temp @110℃ Chamber | ≤140℃ |
RF Performance Test Charts
Measured data from factory dedicated fixture, intuitively showing full-band RF transmission stability
57~64GHz Return Loss Test Curve
Test Key Points: All RF channels reach S11≥10dB across DC~67GHz full band, with excellent RF matching and no signal drift or attenuation distortion during long-term aging.
RF Insertion Loss Test Curve
Test Key Points: Insertion loss of all RF channels is stable and controllable without sharp attenuation, ensuring accurate and reliable test data for millimeter-wave chip aging.
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